Nanowires as quasi-1D materials have been widely used in nanoelectronics. However, to date, many of the alignment methods used to fabricate nanowire-based devices lack precise registration control, resulting in notable uncertainties in the achieved performance. To better understand this issue, a theoretical framework has been developed to describe the probability density function of the performance metric distribution of printed arrayed devices, which is in excellent agreement with experimental observations. This is the first step towards material-device-circuit co-design of contact-printed nanowire-based electronics!
Congratulations Fengyuan et al!